Diffraction Pat Measuring Device

Features

Specifications

• General Description:
  C/o densitometer and recorder; determins rate of d spacings from electron and x-ray diffraction patterns; automatically produces permanent expanded chart record of variations in film density along selected track; chart may be read to line spacing of between 0.05 and 0.10 mm for d value determinations; outer support ring has 360 degrees protractor scale; bench sz 44 x 16 in.
• Federal Supply Class (fsc):
  Optical instruments, test equipment, components and accessories
• National Stock Number (nsn):
  6650-01-250-1243