Electronic Systems Test Set

Features

Specifications

• Inclosure Feature:
  Multiple item w/housing
• Test Type For Which Designed:
  Electronic systems testing
• Supplementary Features:
  Lock-in amplifier system; c/o a lock-in amplifier, high z/low z preamplp/n 165, current input preamplifier 164, low noise, medium impedance preamplifier p/n 166; low noise high impedance preamplifier p/n 167; differential amplifier p/n 168; cable assembly p/n 391v1& programming interface p/n ieee-488
• Federal Supply Class (fsc):
  Electrical and electronic properties measuring and testing instruments
• National Stock Number (nsn):
  6625-01-116-6816