Semiconductor Device Test Set

Features

Specifications

• Width:
  425.5 millimeters
• Ac Voltage Rating:
  Between 100.0 volts and 240.0 volts
• Frequency Rating:
  Between 48.0 hertz and 66.0 hertz
• Depth:
  574.0 millimeters
• Electrical Power Source Relationship:
  Operating
• Inclosure Feature:
  Single item w/housing
• Test Type For Which Designed:
  Rf impedance; semiconductor measurement
• Phase:
  Two
• Functional Description:
  Performs analysis of 14 parameters with 4.5 digit resolution across a 1 to 1000 mhz freq range
• Height:
  230.0 millimeters
• Surface Treatment:
  Any acceptable
• Federal Supply Class (fsc):
  Electrical and electronic properties measuring and testing instruments
• National Stock Number (nsn):
  6625-01-259-8161
• Special Features:
  Opr temp 0 - 55 degrees c; type of tests: izi-theda, iyi-theda, iri-theda r-x, g-b, ix-iy, l-r x g x d x q c-r x g x d x q; -40 to +40 vdc bias internal and external; +.1 amps dc max for dc bias; internal, external, or manual trigger