Semiconductor Device Test Set

Features

Specifications

• Width:
  4.250 inches
• Length:
  5.500 inches
• Joint Electronics Type Designation System Item Name:
  Test set, semiconductor device
• Joint Electronics Type Designation System Item Type Number:
  Ts-3253/tpm-39
• Material And Location:
  Aluminum housing
• Inclosure Feature:
  Single item w/housing
• Test Type For Which Designed:
  Microwave diode current
• Operating Test Capability:
  Microamphere meter range 0-1000 ua dc
• Height:
  3.880 inches
• Surface Treatment:
  Enamel
• Fsc Application Data:
  Test set, elect. Equip.
• Federal Supply Class (fsc):
  Electrical and electronic properties measuring and testing instruments
• National Stock Number (nsn):
  6625-00-222-1117